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A 0.95-mW 6-b 700-MS/s Single-Channel Loop-Unrolled SAR ADC in 40-nm CMOS
Chen Long
Ragab Kareem
Tang Xiyuan
Song Jeonggoo
Sanyal Arindam
Sun Nan
IEEE Transactions on Circuits and Systems II-Express Briefs, 64(3), pp 244-248, 2017-3
Summary
This brief presents a low-power and high-speed single-channel successive approximation register (SAR) analog-to-digital converter (ADC). It uses a loop-unrolled architecture with multiple comparators. Each comparator is used not only to make a comparison but also to store its output and generate an asynchronous clock to trigger the next comparator. The SAR logic is significantly simplified to increase speed and reduce power. The comparator offset and decision time are optimized with a bidirectional single-side switching technique by controlling the input common-mode voltage V-cm. To remove the nonlinearity due to the comparators-offset mismatch, a simple and effective V-cm - adaptive offset calibration technique is proposed. The prototype ADC in 40-nm CMOS achieves a 35-dB signal to noise-plus- distortion ratio and a 48-dB spurious-free dynamic range at a 700-MS/s sampling rate. It consumes 0.95 mW, leading to a Walden figure-of-merit (FOM) of 30 fJ/conversion-step and a Schreier FOM of 153.4 dB.
Keywords
Analog-to-digital converter (ADC); high speed; offset calibration; successive approximation register (SAR)
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