科研之友
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摘要
For predicting life for light-emitting devices quickly and accurately, a novel life prediction model, namely an extrapolation model of accelerated life and stress, has been proposed. In this model, a Weibull function is employed to fit luminance decay data under multiple groups of accelerated stresses, and the corresponding accelerated life is obtained. By determination coefficients and root mean square errors, a power function is determined as an extrapolated function to describe the relationship between accelerated life and stress and the life of the light-emitting devices. For organic light-emitting diodes, three groups of constant-stress accelerated degradation tests were conducted by increasing current stress. An extrapolation model of accelerated life and stress was applied to process the collected luminance decay data and was evaluated by a careful comparison with organic light-emitting diode life. The results indicate that the self-designed experimental scheme for organic light-emitting diode is feasible and versatile; the predicted life is 17,113 hours, which is close to the service life derived from user feedback, and the relative error is only 2.2%. This shows that the extrapolation model of accelerated life and stress has high precision; the model reveals the expected law of luminance changing with time and intuitively depicts the life characteristics under accelerated stresses without conventional life tests. This will pave the way for a new method to predict and evaluate the life of modern light-emitting devices.
