Adsorption and manipulation of carbon onions on highly oriented pyrolytic graphite studied with atomic force microscopy

作者：Zhou Jianfeng; Shen Ziyong^*; Hou Shimin; Zhao Xingyu; Xue Zengquan; Shi Zujin; Gu Zhennan

来源：Applied Surface Science, 2007, 253(6): 3237-3241.

DOI：10.1016/j.apsusc.2006.07.012

• atomic force microscopy (AFM)
• carbon onions
• adsorption properties
• nano-scale manipulation

Carbon onions produced by DC arc discharge method were deposited on highly oriented pyrolytic graphite (HOPG) surface and their adsorption and manipulation was studied using an atomic force microscopy (AFM). Well-dispersed adsorption of carbon onions on HOPG surface was obtained and aggregations of onions were not observed. The van der Waals interaction between the onion and HOPG surface and that between two onions, were calculated and discussed using Hamaker's theory. The manipulation of adsorbed onions on HOPG surface was realized using the AFM in both the raster mode and the vector mode. The controllability and precision of two manipulation modes were compared and the vector mode manipulation was found superior, and is a useful technique for the construction of nano-scale devices based on carbon onions.

• 出版日期2007-1-15
• 单位北京大学