Automated crystal orientation and phase mapping in TEM

作者：Rauch E F^*; Veron M

来源：Materials Characterization, 2014, 98: 1-9.

DOI：10.1016/j.matchar.2014.08.010

• ACOM-TEM
• Transmission electron microscopy
• Precession electron diffraction
• Crystallographic orientation
• Phase mapping
• Template matching

The paper describes an automated crystal orientation and phase mapping technique that allows nanoscale characterization of crystalline materials with a transmission electron microscope. The template matching strategy used to identify the diffraction patterns is detailed and the resulting outputs of the technique are illustrated. Some examples of applications are used to demonstrate the capability of the tool and potential developments are discussed.

• 出版日期2014-12