Atomic force microscope characterization of self-assembly behaviors of cyclo[8] pyrrole on solid substrates

作者:Xu, Hai*; Zhao, Siqi; Xiong, Xiang; Jiang, Jinzhi; Xu, Wei; Zhu, Daoben; Zhang, Yi; Liang, Wenjie; Cai, Jianfeng*
来源:Chemical Physics Letters, 2017, 674: 151-156.
DOI:10.1016/j.cplett.2017.02.063

摘要

Cyclo [8] pyrrole (CP) is a porphyrin analogue containing eight alpha-conjugated pyrrole units which are arranged in a nearly coplanar conformation. The pi-pi interactions between CP molecules lead to regular aggregations through a solution casting process. Using tapping mode atomic force microscope (AFM), we investigated the morphology of self-assembled aggregates formed by deposition of different CP solutions on different substrates. We found that in the n-butanol solution, nanofibrous structures could be formed on the silicon or mica surface. Interestingly, on the highly oriented pyrolytic graphite (HOPG) surface, or silicon and mica surface with a toluene solution, only irregular spherical structures were identified. The difference in the nanomorphology may be attributed to distinct interactions between molecule-molecule, molecule-solvent and molecule-substrate.