摘要

This article discusses methodology for constructing control charts to monitor the percentiles of a Weibull process with known shape parameter. Periodic samples are censored at the smallest observed value. Charts with alarm and warning limits are studied, and these limits are derived using theoretical results based on the first-order statistic. The performance of the proposed charts is evaluated and compared using average run lengths. A numerical application concerning life tests of an electronic product is presented to illustrate the methods.

  • 出版日期2011