Anisotropic electrical properties in bismuth layer structured dielectrics with natural super lattice structure

作者：Kojima Takashi^*; Kimura Junichi; Suzuki Muneyasu; Takahashi Kenji; Oikawa Takahiro; Sakashita Yukio; Kato Kazumi; Watanabe Takayuki; Takenaka Tadashi; Yamada Tomoaki; Funakubo Hiroshi

来源：Applied Physics Letters, 2012, 101(1): 012907.

DOI：10.1063/1.4733326

• bismuth compounds
• current density
• dielectric thin films
• leakage currents
• permittivity
• size effect
• strontium compounds
• superlattices

Dielectric property of epitaxial SrBi4Ti4O15 thin films with (001)-, (11 (10) under bar)-, (105)/(015)-, and (100)/(010)-orientations was investigated as a function of film thickness. As the tilting angle of c-axis from the surface normal is smaller, the relative dielectric constant begins to degrade at thinner thickness; eventually, the (001)-oriented films for which the c-axis is vertical to the substrate do not show noticeable degradation. The leakage current density also strongly depends of the tilting angle of the c-axis. The results indicate that the layer structure of SrBi4Ti4O15 exhibits a small size effect with high insulation performance.

• 出版日期2012-7-2