Nanoscale and submicron fatigue crack growth in nickel microbeams

作者：Yang Y; Yao N; Imasogie B; Soboyejo W O^*

来源：Acta Materialia, 2007, 55(13): 4305-4315.

DOI：10.1016/j.actamat.2007.03.027

• short fatigue crack growth
• focused ion beam (FIB)
• thin films
• slip bands

This paper presents a novel edge-notched microbeam technique for the study of short fatigue crack growth. The technique is used to study submicron and nanoscale fatigue in LIGA Ni thin films with columnar microstructures. The edge-notched microbeams were fabricated within LIGA Ni thin films, using focused ion beam (FIB) techniques. The microbeams were then cyclically deformed to failure at a stress ratio of 0.1. Different slip-band structures were observed below the nanoscale notches. Cyclic deformation resulted in the formation of primary slip bands below the notch. Subsequent crack growth then occurred by the unzipping of fatigue cracks along intersecting slip bands. The effects of the primary slip bands were idealized using dislocation-based models. These were used to estimate the intrinsic fatigue threshold and the fatigue endurance limit. The estimates from the model are shown to be consistent with experimental data from prior stress-life experiments and current/prior fatigue threshold estimates.

• 出版日期2007-8