Design of Effective Supply Voltage Monitor for Measuring Power Rails of Integrated Circuits

作者：Okumoto Takeshi^*; Yoshikawa Kumpei; Nagata Makoto

来源：IEICE TRANSACTIONS ON ELECTRONICS, 2013, E96C(4): 538-545.

DOI：10.1587/transele.E96.C.538

• noise detection circuit
• power supply noise
• power supply integrity
• systems-on-a-chip

An effective supply voltage monitor evaluates dynamic variation of (V-dd-V-ss) within power rails of integrated circuits on a die. The monitor occupies an area of as small as 10.8 x 14.5 mu m(2) and is followed by backend digitizing circuits, both using 3.3 V thick oxide transistors in a 65 nm CMOS technology for covering all power domains from core circuits to peripheral I/O rings. A prototype demonstrates capturing of effective supply voltage waveforms in digital (shift registers) as well as in analog (4 bit Flash ADC) circuits.

• 出版日期2013-4