A study of an AIEM model for bistatic scattering from randomly rough surfaces

作者：Wu Tzong Dar^*; Chen Kun Shan; Shi Jiancheng; Lee Hung Wei; Fung A K

来源：IEEE Transactions on Geoscience and Remote Sensing, 2008, 46(9): 2584-2598.

DOI：10.1109/TGRS.2008.919822

• bistatic scattering
• geometrical optics model (GOM)
• integral equation model (IEM)
• Kirchhoff approximation (KA)
• rough surface
• small perturbation model (SPM)

In this paper, we study the bistatic scattering using an advanced integral equation model (AIEM). By keeping all the surface current terms in the Kirchhoff surface fields, the bistatic scattering coefficients are obtained. For simplification the complete Kirchhoff field did not cast into the derivation of the complementary field. We compare varied updated versions of IEM-based models with the small perturbation model, geometrical optics model, and Kirchhoff approximation standard models at respective regions of validity. The results indicate that the new AIEM provides much more accurate predictions for bistatic scattering.

• 出版日期2008-9
• 单位中央民族大学