摘要

The aim of this work is to find how substrate bias affect the microstructure, mechanical, and tribological properties of the a-C/H films deposited on Ti6Al4V by magnetron sputtering. In order to attain this purpose, the structure of the deposited a-C/H film was investigated by scanning electron microscopy. Chemical bonding was examined by Raman spectroscopy techniques. Mechanical and tribological properties were evaluated using nanoindentation, scratch, internal stress, and ball-on-disk friction testing. The results showed that the sp(2) content in a-C/H films increased as the bias voltage increased from -400 to -1200 V, indicating the graphitization of the films. The hardness (H) decreased from 29 to 18 GPa and the adhesion strength ranged from 13.1 to 25.3 N with increasing bias substrate. The average friction coefficient decreased at a bias voltage of -300 Vand increased when the bias voltage increased to -1200 V. The best tribological performance was reached at -600 V bias voltage. Reasons for the changing of structures, mechanical and tribological properties of a-C/H films were proposed.