作者：Spagnuolo Giovanni*; Petrone Giovanni; Vasconcelos Samuel; Cecati Araujo Carlo; Friis Madsen Erik; Gubia Eugenio; Hissel Daniel; Jasinski Marek; Knapp Wilfried; Liserre Marco; Rodriguez Pedro; Teodorescu Remus; Zacharias Peter
来源：IEEE Industrial Electronics Magazine, 2010, 4(1): 38-51.
DOI：10.1109/MIE.2010.935863
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