A new equivalent circuit model of IGBT for simulation of current sensors

作者:Kao, CH*; Tseng, CC; Lee, FM; Shen, ZJ
来源:IEEE Transactions on Power Electronics, 2005, 20(4): 725-731.
DOI:10.1109/TPEL.2005.850909

摘要

A new equivalent circuit model for insulated gate bipolar transistor is presented. It takes into account both electron and hole conduction in sensors and is incorporated with SPICE3 for the simulation of three types of current sensors, namely active, bipolar, and MOS sensors. It adopts a multiMOS model to include the doping variation in the MOS body. The results agree well with the current sensing measurements within an average error of 4.4%.