A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits

作者：Du, Yankang^*; Chen, Shuming; Chen, Jianjun

来源：IEEE Transactions on Device and Materials Reliability, 2014, 14(1): 213-219.

DOI：10.1109/TDMR.2013.2263834

• Layout
• multiple single-event transients (MSETs)
• sensitive area
• vulnerabilities

Multiple single-event transients (MSETs) are evaluated from the perspective of sensitive area. First, a simple model is proposed to analyze the sensitive area of simple logic cells. Based on this simple model, the vulnerabilities of MSETs sensitive areas are then calculated. At last, a layout-level approach is designed to reduce the vulnerabilities of the MSETs sensitive areas. Our simulation results present that this layout-level approach could efficiently reduce the occurrence chance of MSETs.

• 出版日期2014-3
• 单位中国人民解放军国防科学技术大学