Line defects embedded in three-dimensional photonic crystals

作者:Yan QF; Zhou ZC; Zhao XS*; Chua SJ
来源:Advanced Materials, 2005, 17(15): 1917-+.
DOI:10.1002/adma.200500047

摘要

Conventional optical photolithography is used to create photoresist patterns on a preformed silica colloidal crystal film. Upon regrowth of the same silica colloidal crystal followed by removal of the photoresist patterns, air-core line defects are successfully introduced into the self-assembled silica colloidal crystal (see Figure and inside cover).

  • 出版日期2005-8-4