摘要

The most effective methods of digital processing based on the analysis of the brightness and frequency characteristics of the topographic and polarization-optical contrasts of structural defects are considered by example of single crystals of Si and 6H-SiC. The best results are obtained by using discrete wavelet analysis and images with a high dynamic range (HDR images). The possibility of removing the main noise-inducing factors-background inhomogeneities and granularity-on the experimental contrast by digital methods and of their modeling is shown. A procedure of the quantitative estimation for the efficiency of the digital processing and wavelet basis choice is proposed.

  • 出版日期2014-12