摘要
Depth resolved X-ray photoelectron spectroscopy (XPS) combined with a 25 mu m liquid jet is used to quantify the spatial distribution of 3 nm SnO2 nanoparticles (NPs) from the air-water interface (AWI) into the suspension bulk. Results are consistent with those of a layer several nm thick at the AWI that is completely devoid of NPs.
- 出版日期2014
- 单位煤炭科学技术研究院有限公司