摘要
The characteristic muonic X-ray measuring system for low-pressure gas samples was constructed to investigate the initial process of muonic atom formation. Low-background characteristic muonic X-ray spectra were obtained for neon (1.0 bar) and nitrogen mono-oxide samples (0.99 bar) by muon irradiation at 19 MeV/c. A deviation of characteristic muonic X-ray intensity patterns both for muonic nitrogen and oxygen atoms in nitrogen mono-oxide sample between our low-pressure experiment and the previous high-pressure experiment was found. The muon capture probability was also determined and compared with estimates in the previous work and with empirical estimates.
- 出版日期2011-10