Negative Muon Capture on Nitrogen Oxide Molecules

作者:Ninomiya Kazuhiko*; Ito Takashi U; Higemoto Wataru; Kita Makoto; Shinohara Atsushi; Nagatomo Takashi; Kubo Kenya; Strasser Patrick; Kawamura Naritoshi; Shimomura Koichiro; Miyake Yasuhiro; Miura Taichi
来源:Journal of the Korean Physical Society, 2011, 59(4): 2917-2920.
DOI:10.3938/jkps.59.2917

摘要

The characteristic muonic X-ray measuring system for low-pressure gas samples was constructed to investigate the initial process of muonic atom formation. Low-background characteristic muonic X-ray spectra were obtained for neon (1.0 bar) and nitrogen mono-oxide samples (0.99 bar) by muon irradiation at 19 MeV/c. A deviation of characteristic muonic X-ray intensity patterns both for muonic nitrogen and oxygen atoms in nitrogen mono-oxide sample between our low-pressure experiment and the previous high-pressure experiment was found. The muon capture probability was also determined and compared with estimates in the previous work and with empirical estimates.

  • 出版日期2011-10