科研之友
微信
新浪微博
Facebook
分享链接
摘要
This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a nondestructive technique based on the interaction between wave and material in the 26-40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known.
- 出版日期2015-4
