Advanced analytical techniques to characterizematerials for electrochemical capacitors

作者:Pierre-Louis Taberna; Patrice Simon; Zifeng Lin
来源:Current Opinion in Electrochemistry, 2018, 9: 18-25.
DOI:10.1016/j.coelec.2018.03.004

摘要

This review covers recent developments in advanced analyticaltechniques to characterize materials for electrochemicalcapacitors. For double layer capacitors, examples of the use ofin situ X-ray photoelectron spectroscopy (XPS), pulsedelectrochemical mass spectrometry (PEMS) technique,temperature-programmed desorption coupled with massspectroscopy (TPD-MS) technique, in situ NMR spectroscopy,and in situ dilatometry measurement are presented, forstudying carbon/electrolyte interface with a focus ontoelectrolyte ions confinement in nanopores and changes duringageing. For the pseudocapacitive system, in situ X-ray(neutron) diffraction or scattering, in situ dilatometry technique,cavity micro-electrode, in situ Raman spectroscopy, TPD-MStechnique, and electrochemical quartz crystal microbalance(EQCM) technique have been employed for studying materialsstructure, electrochemical kinetic, interface interaction, andions adsorption/desorption. These advanced analyticaltechniques probe insight into charge storage mechanisms, andguiding the fast development of supercapacitors.

  • 出版日期2018