Anisotropy of ferroelectric and piezoelectric properties of Bi3.15Pr0.85Ti3O12 thin films on Pt(100)/Ti/SiO2/Si substrates

作者：Hu G D^*; Fan S H; Cheng X

来源：Journal of Applied Physics, 2007, 101(5): 054111.

DOI：10.1063/1.2653878

Bi3.15Pr0.85Ti3O12 (BPT) thin films with (100) (alpha((100))=89.1%), (117) (alpha((117))=83.2%), and (001) (alpha((001))=99.7%) orientations and a c-axis-oriented (alpha((001))=99.9%) Bi4Ti3O12 (BT) film were deposited on Pt(100)/TiO2/SiO2/Si substrates using a metal organic decomposition process. Both the values of the remanent polarization (P-r) and coercive field (E-c) of the (001)-oriented BPT film are about 50% higher than those of the BT film with the same orientation, indicating that the ferroelectric properties of BT along the c axis can be improved by doping of praseodymium. Nevertheless, the major polarization vector of BPT is still close to the a axis rather than the c axis due to the fact that the P-r values of the (100)-oriented BPT film are about one and four times larger than those of (117)- and (001)-oriented BPT films, respectively. Based on the volume fractions of (100)-, (117)-, and (001)-oriented grains in BPT films with three orientations, the P-r values of the purely (100)-, (117)-, and (001)-oriented BPT films can be predicated to be about 28.2, 11.1, and 5.3 mu C/cm(2), respectively. The maximum of the piezoelectric coefficient of BPT can be demonstrated to also be close to the a axis by the piezoelectric measurements using an atomic force microscope in the piezoresponse mode.

• 出版日期2007-3-1
• 单位山东建筑大学; 暨南大学