Mechanical twinning and detwinning in pure Ti during loading and unloading - An in situ high-energy X-ray diffraction microscopy study

作者：Wang L^*; Lind J; Phukan H; Kenesei P; Park J S; Suter R M; Beaudoin A J; Bider T R

来源：Scripta Materialia, 2014, 92: 35-38.

DOI：10.1016/j.scriptamat.2014.08.008

• High-energy X-ray diffraction microscopy
• Titanium
• In situ mechanical testing
• Twinning
• Detwinning

Far-field high-energy X-ray diffraction microscopy (HEDM) was used to study {10 (1) over bar2} ((1) over bar 011) twinning in Ti. Twin nucleation within a bulk parent grain is observed at a resolved shear stress (RSS) of 225 MPa. During unloading, the RSS on the twin plane reversed sign, providing a driving force for detwinning. Formation of the twin, however, prevented the parent grain from returning to its original stress state even after complete unloading. The twin morphology and surrounding environment were examined using near-field HEDM.

• 出版日期2014-12-1