A Device Reactive Capability Assessment Model Based on Improving Voltage Stability L Indicator

作者:Deng Qi*; Lv Lin; Chen Jingrui; Xu Xiaofeng
来源:International Conference on Manufacturing Science and Technology (ICMST 2011), 2011-09-16 to 2011-09-18.
DOI:10.4028/www.scientific.net/AMR.383-390.2561

摘要

Taking advantage of improving voltage stability L indicator, voltage level, active power loss to assess device reactive capability in overload situations. Considering the intermediate buses which connect the generator bus and load bus, the compound buses which involve the two types of buses, improving voltage stability L indicator is proposed. So device reactive capability could be calculated. The example shows the best reactive device is generator, and the second one is capacitor bank and the last one is transformer tap. Assessment of reactive device capability is beneficial and practical for operation stuff to take appropriate measures in order to transfer overload situations into normal state.

  • 出版日期2012
  • 单位成都大学

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