An efficient diagnostic test pattern generation framework using Boolean satisfiability

作者:Zheng Feijun*; Cheng Kwang Ting; Yan Xiaolang; Moondanos John; Hanna Ziyad
来源:16th Asian Test Symposium, 2007-10-08 to 2007-10-11.
DOI:10.1109/ATS.2007.80

摘要

This paper presents a diagnostic test pattern generation (DTPG) framework based upon a Boolean Satisfiability engine. We first propose an enhanced miter-based model for distinguishing fault candidates that can achieve greater efficiency as well as can prove a group of un-differentiable faults. The model can also be used to generate diagnostic tests for distinguishing faults of different fault types. Based on this model, we propose a diagnostic pattern compaction strategy. By exploring "don't cares" at the primary inputs, the number of required diagnostic patterns can be reduced. Experimental results show that the proposed method achieves a greater diagnosis resolution when combined with existing approaches. Also, fewer diagnostic test patterns are needed.

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