Generation of Mixed Test Sets for Transition Faults

作者：Pomeranz Irith^*

来源：IEEE Transactions on Very Large Scale Integration Systems, 2012, 20(10): 1895-1899.

DOI：10.1109/TVLSI.2011.2161786

• Broadside tests
• full-scan
• skewed-load tests
• test generation
• transition faults

Test sets that contain both broadside and skewed-load tests are important for achieving the highest possible delay fault coverage for standard-scan circuits. Both types of tests can be represented as < s(1)v(1),s(2)v(2)>, where s(1) and s(2) are states, v(1) and v(2) and are primary input vectors. To facilitate the generation of a mixed test set that contains both broadside and skewed-load tests, this paper associates with s(2) a property that can be used for estimating whether a skewed-load or a broadside test is more likely to exist with s(2) in its second pattern. This paper uses this property for guiding a test generation procedure to consider only one of the two test types for most of the target faults.

• 出版日期2012-10