Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction

作者：Zhang K H L; Regoutz A; Palgrave R G; Payne D J; Egdell R G^*; Walsh A; Collins S P; Wermeille D; Cowley R A

来源：Physical Review B, 2011, 84(23): 233301.

DOI：10.1103/PhysRevB.84.233301

The Poisson ratio. of In2O3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO2 substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.

• 出版日期2011-12-1