摘要

A simple and effective two-step method to detect and localize scattering objects from the measurements of the total electric field, collected at a single frequency on a planar domain, is presented. The first step consists in solving a linear inverse source problem, looking for surface equivalent currents on a plane located between the measurement surface and the objects themselves. Thus, the equivalent currents associated with both the scatterer presence and the background contribution are obtained. In the second step, the support of the equivalent currents associated with the objects is separated from the background by exploiting the low-rank property of the background field. The proposed method does not require information on the source, except for its frequency, and it is easily implementable and entails a low computational burden. Experimental results validate the method.

  • 出版日期2017-3