BROADBAND MEASUREMENTS OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS AT HIGH TEMPERATURES USING CIRCULAR CAVITY METHOD

作者：Li, E^*; Nie, Z; Guo, G; Zhang, Q; Li, Z; He, F

来源：Progress in Electromagnetics Research-Pier, 2009, 92: 103-120.

DOI：10.2528/PIER09030904

We describe a broadband microwave test system that can measure dielectric properties of microwave low-loss materials at high temperatures using circular cavity method. The dielectric constants and loss tangents of samples at different temperatures were calculated from measured shifts of resonant frequencies and unloaded quality factors of the multimode cavity with and without sample. Detailed design and fabrication of the circular cavity capable of working at temperatures up to 1500 degrees C are discussed. The measurement theory and new calculation method of the radius and length of the cavity at different temperatures are presented. The hardware system was built to measure dielectric properties at wide frequency band from 7 to 18GHz and over a temperature range from room temperature to 1500 degrees C. Measurement results of the dielectric properties of quartz samples are given and show a good agreement with the reference values.

• 出版日期2009
• 单位航天材料及工艺研究所; 电子科技大学