Size dependence of buckling strains of Cr films, Cu films and Cu/Cr multilayers on compliant substrates

作者：Wu, K.; Yuan, H. Z.; Liang, X. Q.; Zhang, J. Y.; Liu, G.^*; Sun, J.^*

来源：Scripta Materialia, 2018, 146: 1-4.

DOI：10.1016/j.scriptamat.2017.10.025

• Cr films
• Cu films
• Cu/Cr multilayers
• Buckling strain
• Size effect

The buckling strain epsilon(B) of Cr films and Cu films exhibits opposite film thickness h dependence: the CB of Cr films decreases monotonically, while the epsilon(B) of Cu films increases monotonically with the increasing h. The delamination of Cr films follows the strain energy criterion while the Cu films are buckle-limited. The epsilon(B) of Cu/Cr nano structured metallic multilayers (NMMs), much higher than that of Cr films, increases as the modulation period lambda increases. A modified strain energy criterion involving interfacial adhesion and plastic deformation has been developed to describe the evolution of epsilon(B) of Cu/Cr NMMs with lambda.

• 出版日期2018-3-15
• 单位西安交通大学