摘要
This paper deals with Cu agglomeration and diffusion that occur in Cu thin films during annealing in supercritical CO2. Cu was deposited by using direct current magnetron sputtering on trench-patterned substrates. Annealing was performed in different atmospheres, namely, pure CO2, CO2 mixed with H-2, CO2 mixed with hexafluoroacetylacetone (Hhfac), and CO2 mixed with H-2 and Hhfac. The conspicuous agglomeration of Cu films was observed after annealing in the H-2-mixed supercritical CO2. This is because Cu diffusion is accelerated by reduction and oxidation that proceed simultaneously on the Cu surface.
- 出版日期2015-5