Analysing Surface Structures on (Ga, Mn)As by Atomic Force Microscopy

作者:Piano S*; Rushforth A W; Edmonds K W; Campion R P; Adesso G; Gallagher B L
来源:Journal of Nanoscience and Nanotechnology, 2012, 12(9): 7545-7549.
DOI:10.1166/jnn.2012.6553

摘要

Using atomic force microscopy, we have studied the surface structures of high quality molecular beam epitaxy grown (Ga, Mn)As compound. Several samples with different thickness and Mn concentration, as well as a few (Ga, Mn)(As, P) samples have been investigated. All these samples have shown the presence of periodic ripples aligned along the [110] direction. From a detailed Fourier analysis we have estimated the period (similar to 50 nm) and the amplitude of these structures.

  • 出版日期2012-9