An empirical study on improving the manufacturing informatization index system of China

作者：Guo Wei; Chen Ke; Wang Jia

来源：1st International Workshop on Knowledge Discovery and Data Mining, 2008-01-23 to 2008-01-24.

The manufacturing informatization index system (MIIS) is an indispensable tool to measure the informatization level of Chinese manufacturing industry and evaluate the implementation effect of the manufacturing informatization engineering (MIE) conducted by the government of China. Thus far, the constructs of MIIS has not been validated. This study fills this void by employing structural equation modeling (SEM) to test the MIIS model. The samples in this study come from the standard database of Chinese manufacturing informatization established by the data survey of MIE during the "Tenth Five-Year Plan" period including 12896 enterprises samples from 11 manufacturing industries and 3472 support samples from 29 provinces of China. Based on the results of SEM analysis, some indexes of MIIS are adjusted and an improved MIIS is got at last. This empirical study proves that combining SEM technology and standard data resources would be an ideal method to improve MIIS.

• 出版日期2007
• 单位天津大学