Microstructure of epitaxial Ba0.7Sr0.3TiO3/SrRuO3 bilayer films on SrTiO3 substrates

作者：He JQ^*; Vasco E; Jia CL; Dittmann R; Wang RH

来源：Journal of Applied Physics, 2005, 97(10): 104907.

DOI：10.1063/1.1897067

The thickness evolution of the microstructure of epitaxial Ba0.7Sr0.3TiO3 thin films grown on SrRuO3/SrTiO3 was investigated by means of transmission electron microscopy. Within the Ba0.7Sr0.3TiO3 layer, a layered structure (three sublayers) is distinguished as for the configuration of lattice strain and defects. The first sublayer extends for 3 nm from the lattice-coherent Ba0.7Sr0.3TiO3/SrRUO3 interface. The second 13-nm-thick sublayer forms a semicoherent interface with the first sublayer due to the creation of a misfit dislocation network. The third sublayer extends beyond the second sublayer exhibiting a structure characterized by compact columnar features. Planar defects are formed at the boundaries between such features. The formation of a layered structure within the Ba0.7Sr0.3TiO3 films is discussed in the light of the growth modes of films on lattice-mismatched substrates.

• 出版日期2005-5-15
• 单位武汉大学