Double Self Quotient Image Based Image Flattening for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel

作者：Song Young Chul^*; Kim Se Yun; Park Kil Houm

来源：Japanese Journal of Applied Physics, 2010, 49(3): 038003.

DOI：10.1143/JJAP.49.038003

This paper presents the results of using self quotient image (SQI) to flatten the background region of a thin film transistor liquid crystal display image. To overcome an inherent shortcoming of SQI method, namely the halo effect in thin film transistor liquid crystal display images, double SQI method is introduced. Experimental results demonstrate that SQI can be used effectively to eliminate a non-uniformity of the background region in a test image.

• 出版日期2010