摘要
The effects of substrate temperature (T-sub) Of Si(1 0 0) on the orientation of hexagonal Boron Nitride (h-BN) films synthesized using magnetron sputtering and Plasma-Enhanced CVD (PECVD) were studied, respectively. It was observed that higher T-sub could result in the growth of (0 0 0 2) oriented h-BN films and improve the crystallinity of the films, in contrast the films with the c-axis basically parallel to the surface at lower ones. A tentative explanation on the mechanism of the orientation characteristic is suggested, under the integration of compressive stress due to ion bombardment and desorption from thermal excitation.
- 出版日期2002-5
- 单位北京工业大学