An Error Diagnosis Technique Based on Clustering of Elements

作者：Shioki Kosuke^*; Okada Narumi; Watanabe Kosuke; Hirose Tetsuya; Kuroki Nobutaka; Numa Masahiro

来源：IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences, 2010, E93A(12): 2490-2496.

DOI：10.1587/transfun.E93.A.2490

• EGO error diagnosis
• incremental synthesis
• LUT

In this paper we propose an error diagnosis technique based on clustering LUT elements to shorten the processing time By grouping some elements as a cluster our technique reduces the number of elements to be considered which is effective to shorten the processing time for screening error location sets First the proposed technique partitions the circuit into FFR (fanout free region) called cluster which is a subcircuit composed of LUT elements without fanout After screening the set of clusters including error locations this technique screens error location sets composed of elements in the remaining set of clusters where corrections should be made Experimental results with benchmark circuits have shown that our technique shortens the processing time to 1/170 in the best case and rectifies circuits including 6 errors which cannot be rectified by the conventional technique

• 出版日期2010-12