科研之友
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摘要
We show how contact resonance atomic force microscopy (CR-AFM) can be used to accurately determine the radial elastic moduli of [0001] ZnO nanowires with diameters smaller than 150 nm. Using a realistic tip-nanowire contact geometry, we find the radial indentation modulus from CR-AFM data and the tangential shear modulus from friction-type measurements. Both moduli show a pronounced increase when the wire diameter is reduced below 80 nm. The size dependence of the elastic properties can be explained by a core-shell model that accounts for a bulk-like core and an elastically stiffer surface layer.
- 出版日期2007-12
