科研之友
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摘要
A transparent orthodontic device is used to move the teeth to the final calibration position to form a proper set of teeth. Because the uniform thickness of the device plays an important role in tooth positioning, the accuracy of the device's thickness profile is important for effective orthodontic treatment. However, due to the complexity of the device's geometry and the transparency of the device's material, measuring the complete thickness profile has been difficult. In the present study, a new optical scanning method to measure the thickness profile of transparent plastic orthodontic devices is proposed and evaluated by using scanning electron microscopy (SEM). The error of the new measurement method is less than +/- 18 mu m. The new method can be used to measure the thickness of non-specific, multi-curved, transparent orthodontic devices.
- 出版日期2018-5
