MAPLE preparation and characterization of benzil thin films

作者:Socol M*; Socol G; Rasoga O; Stanculescu F; Stanculescu A; Mihailescu I; Ionita I; Preda N; Enculescu M; Antohe S
来源:Optoelectronics and Advanced Materials-Rapid Communications, 2010, 4(11): 1802-1806.

摘要

In this study the Matrix Assisted Pulsed Laser Evaporation (MAPLE) technique was used to prepare thin films from a low melting point (< 100 degrees C) organic compound (benzil). Optical properties of the films have been investigated by UV-VIS, FTIR and PL spectroscopy. Details about crystallinity were obtained by XRD measurements. FTIR spectra have confirmed the preservation of the chemical structure of the compound during the deposition process. SEM and AFM investigation have evidenced a topography of the MAPLE deposited films characterized by different grain size depending on the deposition conditions. Second harmonic generation measurements have revealed that the MAPLE deposited benzil films have preserved the optical nonliniar properties of the bulk crystalline benzil.

  • 出版日期2010-11