Abnormal solidification of Bi-Te alloys induced by liquid structural states

作者:Zu, Fang Qiu*; Huang, Zhong Yue; Wang, Zhi Zhi; Cui, Xiao; Li, Xiao Yun
来源:Materials Science in Semiconductor Processing, 2010, 13(2): 86-91.
DOI:10.1016/j.mssp.2010.03.004

摘要

In this paper, Bi-60 wt.%Te and Bi-80 wt.%Te alloys are selected for experiments to explore the effects of temperature-induced discontinuous liquid-liquid structure transitions TI-LLST on the solidification behaviors and solidified microstructures. Anomalous changes of electrical resistivity of the liquid Bi-60 wt.%Te and Bi-80 wt.%Te alloys with temperature suggested that TI-LLST occurred within 798-828 and 745-779 degrees C. The solidification results show that solidification behaviors and solidified microstructures of Bi-Te alloys will be apparently distinct when the melt is prepared above the critical temperature. It is found that the nucleation undercooling is larger when the melt experienced the TI-LIST, which leads to finer solidification microstructures.