AFM as an alternative for Young's modulus determination in ceramic materials in elastic deformation regime

作者：Roa J J^*; Oncins G; Dias F T; Vieira V N; Schaf J; Segarra M

来源：Physica C-Superconductivity and Its Applications, 2011, 471(17-18): 544-548.

DOI：10.1016/j.physc.2011.05.249

• AFM-FS
• Ceramic materials
• Young's modulus
• Picoindentation technique
• Hertz equations

A novel alternative to the conventional nanoindentation technique for hard materials is presented. An atomic force microscopy probe is used as an indenter, applying loads in the nN range and producing elastic deformations of a few nanometres. This new technique allows a reduction of the different inherent nanoindenter problems. This result in an increase in the quality of the overall results, and thus provide better understanding of the contact mechanism between the indenter and the sample, yielding Young's modulus values consistent with the literature. This is confirmed by a series of experiments performed on different YBa(2)Cu(3)O(7-x) textured and single crystal samples textured using different techniques.

• 出版日期2011-9