Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments

作者：Yi Feng; Voyles P M^*

来源：Ultramicroscopy, 2011, 111(8): 1375-1380.

DOI：10.1016/j.ultramic.2011.05.004

• Fluctuation electron microscopy
• Nanodiffraction
• Thickness
• Coherence
• Energy filter
• Shot noise

We have explored experimentally the effects of the TEM sample thickness, zero-loss energy filtering, and probe coherence on fluctuation electron microscopy (FEM) experiments implemented using nanodiffraction. FEM measures the variance V of spatial fluctuations in nanodiffraction. We find that V is inversely proportional to the sample thickness, as predicted by earlier models. Energy filtering increases Vat all thicknesses we measured. V increases as the coherence of the probe increases. All of these factors must be carefully controlled to obtain quantitatively reliable FEM data.

• 出版日期2011-7