Noise in a CMOS digital pixel sensor

作者：Zhang Chi; Yao Suying; Xu Jiangtao^*

来源：Chinese Journal of Semiconductors, 2011, 32(11).

DOI：10.1088/1674-4926/32/11/115005

• A/D conversion
• CMOS image sensor
• Digital pixel sensor
• Integration time
• Low light
• Noise performance
• Noise source
• Pattern noise
• Photodiode capacitance
• Random noise
• Reference voltages
• System noise

Based on the study of noise performance in CMOS digital pixel sensor (DPS), a mathematical model of noise is established with the pulse-width-modulation (PWM) principle. Compared with traditional CMOS image sensors, the integration time is different and A/D conversion is implemented in each PWM DPS pixel. Then, the quantitative calculating formula of system noise is derived. It is found that dark current shot noise is the dominant noise source in low light region while photodiode shot noise becomes significantly important in the bright region. In this model, photodiode shot noise does not vary with luminance, but dark current shot noise does. According to increasing photodiode capacitance and the comparator's reference voltage or optimizing the mismatch in the comparator, the total noise can be reduced. These results serve as a guideline for the design of PWM DPS.

• 出版日期2011
• 单位天津大学