科研之友
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摘要
Building on the success of aberration correction and the construction of in situ reaction chambers, electron microscopy is poised to make fresh advances in catalyst characterization. More profitable use should be made of photons both as input drivers and as output signals. Secondary electron imaging can provide extra information about the support structure. When collected in coincidence with primary beam energy losses, the secondary electron signal may even open the way to surface barrier height measurement at surface facets on individual nanoparticles.
- 出版日期2011-6
