摘要

Near-field radiation intensity above a tungsten emitter surface was measured using a silica-glass fibrous optical microscope with chromium coating and emitter temperature of 950 K. The aperture size of the glass fibrous probe was 550 mn The signal was detected using a photo-multiplier with an active wavelength range of 950 to 1700 nm and was amplified using a lock-in amplification system corresponding to the sinusoidal movement of the emitter surface with an average amplitude of 2.6 in from the outside to the inside of near-field effect regions. Consequently, it was clearly seen that the detected intensity increased monotonically as the gap between the probe tip and the emitter surface decreased. The tendency for the intensity to increase was in agreement with that of the near-field radiation flux between two semi-infinite planes obtained through calculations using a framework of fluctuation electrodynamics.

  • 出版日期2016