Analysis of delay fault in GNR power interconnects

作者：Bhattacharya Sandip; Das Debaprasad^*; Rahaman Hafizur

来源：International Journal of Numerical Modelling: Electronic Networks, Devices and Fields , 2018, 31(3): e2308.

DOI：10.1002/jnm.2308

• delay fault
• interconnect
• mean free path (MFP)
• multilayer graphene nanoribbon (MLGNR)
• single-layer graphene nanoribbon (SLGNR)
• temperature

In this paper, a delay fault model for multilayer graphene nanoribbon (GNR)-based power interconnects for 16-nm International Technology Roadmap for Semiconductors technology node is developed for both top-contact GNR and side-contact GNR. The delay fault model is developed for different temperature considering the impact of scattering parameters. It is shown that side-contact GNR-based power interconnects can reduce the delay fault significantly in comparison with that of Cu and top-contact GNR interconnects at local, intermediate, and global lengths for a wide range of chip operating temperatures from 233K to 378K.

• 出版日期2018-6