Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions

作者：Vakhshouri Amin^*; Hashimoto Katsushi; Hirayama Yoshiro

来源：Journal of Electron Microscopy, 2014, 63(6): 475-479.

DOI：10.1093/jmicro/dfu028

• combined atomic force/tunneling microscopy
• room temperature tunneling spectroscopy
• thermal drift suppression

We have developed a method of atomic force microscopy (AFM)-assisted scanning tunneling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip-sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature.

• 出版日期2014-12