Does microstructure matter for statistical nanoindentation techniques?

作者:Ulm Franz Josef*; Vandamme Matthieu; Jennings Hamlin M; Vanzo James; Bentivegna Michelle; Krakowiak Konrad J; Constantinides Georgios; Bobko Christopher P; Van Vliet Krystyn J
来源:CEMENT & CONCRETE COMPOSITES, 2010, 32(1): 92-99.
DOI:10.1016/j.cemconcomp.2009.08.007

摘要

In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion. we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 pm in cementitious materials is groundless.