摘要

The reversal process of thin film micron-scale Co/Cu/NiFe rhombic rings in an in-plane magnetic field is investigated by micromagnetic simulation and magnetoresistance measurements. Simulations show that the impingement of reverse domains leads to the formation of multiple 360 degrees domain walls in the ring during low-field cycling. Two types of reversal process can be identified experimentally which are attributed to the presence or absence of residual 360 degrees domain walls in the ring. The reversal path depends on the field history, which affects the population of walls in the ring.

  • 出版日期2011-6-20