A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories

作者：Kang Wooheon^*; Lee Changwook; Lim Hyunyul; Kang Sungho

来源：IEEE Transactions on Reliability, 2015, 64(2): 586-595.

DOI：10.1109/TR.2015.2410274

• 3D memory
• 3D built-in self-repair
• area overhead
• built-in redundancy analysis
• built-in self-test
• repair rate
• yield

A 3-dimensional Built-In Self-Repair (3D BISR) scheme is proposed for 3-dimensional (3D) memories. The proposed 3D BISR scheme consists of two phases: a parallel test-repair phase, and a serial test-repair phase. After all memory dice are simultaneously tested, only the faulty memory dice are serially tested and repaired using one Built-In Redundancy Analysis (BIRA) module. Thus, it is a faster test-repair with low area overhead. The proposed BIRA algorithm with a post-share redundancy scheme performs exhaustive searches for all combinations of spare rows and columns. Experimental results show that the proposed 3D BISR is up to two times faster than the 3D serial test-serial repair BISR when seven 2048 x 2048 bit memory dice are stacked. The proposed 3D BISR requires 44.55% of the area in comparison to a 3D parallel test-parallel repair BISR for four stacked memory dice (one 128 K RAM, two 256 K RAMs, and 512 K RAM). The yield of 3D memories is the highest due to the exhaustive search BIRA algorithm with the post-share redundancy scheme as shown in various experimental results.

• 出版日期2015-6
• 单位test